Park Systems Corp. is a nano-metrology equipment specialist established in 1997, primarily engaged in the development, production, and sale of innovative nano-metrology solutions including Atomic Force Microscopes (AFM), Raman spectrometers, and Imaging Spectroscopic Ellipsometers (ISE). The company is a global leader in providing essential metrology equipment for nanotechnology research and advanced industries like semiconductors and displays, with a focus on accurate and user-friendly AFM systems.ParkSystemsCorp.isanano-metrologyequipmentspecialistestablishedin1997,primarilyengagedinthedevelopment,production,andsaleofinnovativenano-metrologysolutionsincludingAtomicForceMicroscopes(AFM),Ramanspectrometers,andImagingSpectroscopicEllipsometers(ISE).Thecompanyisagloballeaderinprovidingessentialmetrologyequipmentfornanotechnologyresearchandadvancedindustrieslikesemiconductorsanddisplays,withafocusonaccurateanduser-friendlyAFMsystems.
Key Products/TechnologiesKeyProducts/Technologies
**Atomic Force Microscope (AFM) Product Lines**: Comprising Research AFMs (Small Sample AFM), Industrial AFMs (Large Sample AFM), and Automated AFMs. Key models include Park NX-Hivac, Park NX-10, Park XE7, Park NX20 300mm, Park NX20, Park XE15, Park 3DM Series, Park Wafer Series, Park HDM Series, Park PTR Series, Park NX-Bio, Park NX-10 SICM, and Park NX12. The Park NX10, in particular, offers accurate XY scanning through Crosstalk Elimination technology and high-resolution AFM imaging with a low-noise Z detector, along with True Non-Contact™ Mode for extended tip life and minimal sample damage.**AtomicForceMicroscope(AFM)ProductLines**:ComprisingResearchAFMs(SmallSampleAFM),IndustrialAFMs(LargeSampleAFM),andAutomatedAFMs.KeymodelsincludeParkNX-Hivac,ParkNX-10,ParkXE7,ParkNX20300mm,ParkNX20,ParkXE15,Park3DMSeries,ParkWaferSeries,ParkHDMSeries,ParkPTRSeries,ParkNX-Bio,ParkNX-10SICM,andParkNX12.TheParkNX10,inparticular,offersaccurateXYscanningthroughCrosstalkEliminationtechnologyandhigh-resolutionAFMimagingwithalow-noiseZdetector,alongwithTrueNon-Contact™Modeforextendedtiplifeandminimalsampledamage.
**Automated AFM Solutions**: The Park FX40 is an autonomous AFM system integrating robotics, intelligent learning features, and safety features, automating all upfront setup and scanning processes such as probe exchange, identification, beam alignment, sample location, tip approach, and imaging optimization. This technology significantly reduces operator dependency and enables high-throughput, repeatable metrology.**AutomatedAFMSolutions**:TheParkFX40isanautonomousAFMsystemintegratingrobotics,intelligentlearningfeatures,andsafetyfeatures,automatingallupfrontsetupandscanningprocessessuchasprobeexchange,identification,beamalignment,samplelocation,tipapproach,andimagingoptimization.Thistechnologysignificantlyreducesoperatordependencyandenableshigh-throughput,repeatablemetrology.
**Expanded Optical Metrology Solutions**: Provides a comprehensive range of nano-metrology solutions including Imaging Spectroscopic Ellipsometry (ISE), White Light Interferometry (WLI), Nano-Infrared Spectroscopy (NanoIR), and Active Vibration Isolation (AVI) systems. Strategic acquisitions of Accurion (ISE, AVI systems) and Lyncée Tec (Digital Holographic Microscopy, DHM) have further strengthened its optical metrology portfolio.**ExpandedOpticalMetrologySolutions**:Providesacomprehensiverangeofnano-metrologysolutionsincludingImagingSpectroscopicEllipsometry(ISE),WhiteLightInterferometry(WLI),Nano-InfraredSpectroscopy(NanoIR),andActiveVibrationIsolation(AVI)systems.StrategicacquisitionsofAccurion(ISE,AVIsystems)andLyncéeTec(DigitalHolographicMicroscopy,DHM)havefurtherstrengtheneditsopticalmetrologyportfolio.
**SmartScan™ Software**: An AI-powered operating software that streamlines AFM operation, providing intuitive and high-resolution nanoscale measurements for both novice and experienced users, thereby enhancing workflow efficiency.**SmartScan™Software**:AnAI-poweredoperatingsoftwarethatstreamlinesAFMoperation,providingintuitiveandhigh-resolutionnanoscalemeasurementsforbothnoviceandexperiencedusers,therebyenhancingworkflowefficiency.
Core AdvantagesCoreAdvantages
**Proprietary Technology and Patent Portfolio**: Maintains technological leadership with proprietary imaging technologies like True Non-Contact Mode™ and PinPoint™ Nanomechanical Mode, which minimize sample damage and provide quantifiable mechanical property data. This leadership is protected by a robust global patent portfolio of over 200 patents, creating significant barriers to entry for competitors.**ProprietaryTechnologyandPatentPortfolio**:MaintainstechnologicalleadershipwithproprietaryimagingtechnologieslikeTrueNon-ContactMode™andPinPoint™NanomechanicalMode,whichminimizesampledamageandprovidequantifiablemechanicalpropertydata.Thisleadershipisprotectedbyarobustglobalpatentportfolioofover200patents,creatingsignificantbarrierstoentryforcompetitors.
**High Measurement Accuracy and Reliability**: Utilizes a decoupled scanner architecture with independent XY and Z scanners, eliminating crosstalk and delivering distortion-free imaging and highly accurate measurement results. This is crucial for precise nanoscale topographical and material property analysis.**HighMeasurementAccuracyandReliability**:UtilizesadecoupledscannerarchitecturewithindependentXYandZscanners,eliminatingcrosstalkanddeliveringdistortion-freeimagingandhighlyaccuratemeasurementresults.Thisiscrucialforprecisenanoscaletopographicalandmaterialpropertyanalysis.
**Automation and User-Friendliness**: Autonomous AFM systems like Park FX40 and AI-based SmartScan™ software automate complex procedures such as probe exchange, beam alignment, and sample positioning, maximizing user convenience and significantly improving measurement throughput. This supports efficient workflows in both research and industrial settings.**AutomationandUser-Friendliness**:AutonomousAFMsystemslikeParkFX40andAI-basedSmartScan™softwareautomatecomplexproceduressuchasprobeexchange,beamalignment,andsamplepositioning,maximizinguserconvenienceandsignificantlyimprovingmeasurementthroughput.Thissupportsefficientworkflowsinbothresearchandindustrialsettings.
**Broad Product Lineup and Integrated Solutions**: Offers a wide range of nano-metrology solutions, from research-grade to fully automated industrial AFM systems, and integrated optical metrology tools (ISE, WLI, NanoIR, DHM) through recent acquisitions. This enables the company to meet diverse customer needs across various industries, including semiconductors, materials science, and life sciences.**BroadProductLineupandIntegratedSolutions**:Offersawiderangeofnano-metrologysolutions,fromresearch-gradetofullyautomatedindustrialAFMsystems,andintegratedopticalmetrologytools(ISE,WLI,NanoIR,DHM)throughrecentacquisitions.Thisenablesthecompanytomeetdiversecustomerneedsacrossvariousindustries,includingsemiconductors,materialsscience,andlifesciences.
**Global Market Leadership and Strong Customer Base**: Holds a leading position in the global AFM market with an estimated 20.61% market share as of 2023, supported by a global sales network spanning over 30 countries and 11 direct offices in 10 countries. Its clientele includes top semiconductor companies and national research universities worldwide, with a reputation for superior technical support and high customer retention.**GlobalMarketLeadershipandStrongCustomerBase**:HoldsaleadingpositionintheglobalAFMmarketwithanestimated20.61%marketshareasof2023,supportedbyaglobalsalesnetworkspanningover30countriesand11directofficesin10countries.Itsclienteleincludestopsemiconductorcompaniesandnationalresearchuniversitiesworldwide,withareputationforsuperiortechnicalsupportandhighcustomerretention.
Target IndustrieTargetIndustrie
**Semiconductor Industry**: Nanoscale analysis and quality control throughout the semiconductor manufacturing process, including front-end and back-end metrology, EUV mask defect detection and repair, CMP metrology, wafer edge profiling, copper pad metrology, and advanced packaging.**SemiconductorIndustry**:Nanoscaleanalysisandqualitycontrolthroughoutthesemiconductormanufacturingprocess,includingfront-endandback-endmetrology,EUVmaskdefectdetectionandrepair,CMPmetrology,waferedgeprofiling,copperpadmetrology,andadvancedpackaging.
**Materials Science and Engineering**: Nanoscale characterization of polymers, metals and ceramics, thin films, 2D materials, and surface engineering applications.**MaterialsScienceandEngineering**:Nanoscalecharacterizationofpolymers,metalsandceramics,thinfilms,2Dmaterials,andsurfaceengineeringapplications.
**Life Sciences**: Non-destructive imaging of biological samples, nanoscale structural and interaction studies of cells and biomolecules.**LifeSciences**:Non-destructiveimagingofbiologicalsamples,nanoscalestructuralandinteractionstudiesofcellsandbiomolecules.
**Data Storage Industry**: Nanoscale structural analysis and defect inspection.**DataStorageIndustry**:Nanoscalestructuralanalysisanddefectinspection.
**Display Industry**: Precision metrology and quality inspection in flat panel display manufacturing processes.**DisplayIndustry**:Precisionmetrologyandqualityinspectioninflatpaneldisplaymanufacturingprocesses.
**Chemistry and Physics Research**: Advanced metrology for nanotechnology research, new material development, and fundamental scientific studies.**ChemistryandPhysicsResearch**:Advancedmetrologyfornanotechnologyresearch,newmaterialdevelopment,andfundamentalscientificstudies.
Major MarketsMajorMarkets
South Korea, China, Japan, Singapore, Taiwan, IndiaSouthKorea,China,Japan,Singapore,Taiwan,India
Germany, France, United Kingdom, Switzerland, Netherlands, BelgiumGermany,France,UnitedKingdom,Switzerland,Netherlands,Belgium
United States, MexicoUnitedStates,Mexico
Certifications/PatentsCertifications/Patents
**Designation as National Core Technology**: Atomic Force Microscope manufacturing technology designated as a National Core Technology of South Korea.**DesignationasNationalCoreTechnology**:AtomicForceMicroscopemanufacturingtechnologydesignatedasaNationalCoreTechnologyofSouthKorea.
**Patent Portfolio**: Holds over 200 global patents, including 43 domestic and international patents in the field of atomic force microscopy. Key patents include those for AFM equipped with optical measurement devices and methods for acquiring surface information, and apparatus and methods for recognizing target positions in an AFM.**PatentPortfolio**:Holdsover200globalpatents,including43domesticandinternationalpatentsinthefieldofatomicforcemicroscopy.KeypatentsincludethoseforAFMequippedwithopticalmeasurementdevicesandmethodsforacquiringsurfaceinformation,andapparatusandmethodsforrecognizingtargetpositionsinanAFM.
**'AA' Technical Evaluation Rating**: The first KOSDAQ-listed company to secure an 'AA' rating in technical evaluation.**'AA'TechnicalEvaluationRating**:ThefirstKOSDAQ-listedcompanytosecurean'AA'ratingintechnicalevaluation.
**Awards and Recognitions**: Recipient of the '70 Million USD Export Tower' award (2024), '50 Million USD Export Tower' (2022), and '30 Million USD Export Tower' (2020). Named one of Forbes Asia's 'Best Under A Billion' companies in 2023. Designated as a 'KOSDAQ Rising Star' for seven consecutive years. Awarded the Chairman of Financial Supervisory Service Award at the 2024 Korea IR Awards (highest honor in KOSDAQ category). Received the 2016 Global Enabling Technology Leadership Award from Frost & Sullivan. Park NX10 recognized as a NanoKorea 2012 most innovative product. CEO Dr. Sang-il Park honored with the Hanyang Paiknam Award for Engineering (2023).**AwardsandRecognitions**:Recipientofthe'70MillionUSDExportTower'award(2024),'50MillionUSDExportTower'(2022),and'30MillionUSDExportTower'(2020).NamedoneofForbesAsia's'BestUnderABillion'companiesin2023.Designatedasa'KOSDAQRisingStar'forsevenconsecutiveyears.AwardedtheChairmanofFinancialSupervisoryServiceAwardatthe2024KoreaIRAwards(highesthonorinKOSDAQcategory).Receivedthe2016GlobalEnablingTechnologyLeadershipAwardfromFrost&Sullivan.ParkNX10recognizedasaNanoKorea2012mostinnovativeproduct.CEODr.Sang-ilParkhonoredwiththeHanyangPaiknamAwardforEngineering(2023).